标题:
Arrangement and method for the spatially resolved determination of state variables in an examination area
当前申请(专利权)人:
PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH | KONINKLIJKE PHILIPS ELECTRONICS N.V.
发明人:
GLEICH, BERNHARD PHILIPS INTEL. PROP.
简单同族:
AT543428T | CN1774200A | CN1774200B | EP1615544A2 | EP1615544B1 | JP2006524533A | JP2006524533A5 | JP4890242B2 | US20060211941A1 | US7747304 | WO2004091386A2 | WO2004091386A3