标题:
System and method for imaging the reflectance of a substrate
当前申请(专利权)人:
ACADEMISCH MEDISCH CENTRUM BIJ DE UNIVERSITEIT VAN AMSTERDAM
简单同族:
AU2004277760A1 | AU2004277760B2 | CA2541297A1 | CA2541297C | EP1673007A2 | EP1673007B1 | JP2007516009A | JP2007516009A5 | JP2012030088A | NZ546918A | NZ546918B | US20070232874A1 | US20120089031A1 | US20130237860A1 | US8064976 | US8452384 | WO2005032361A2 | WO2005032361A3